DocumentCode
3678642
Title
Fault-resilient decoders and memories made of unreliable components
Author
Bane Vasić;Predrag Ivanis;Srdan Brkic;Vida Ravanmehr
Author_Institution
Department of ECE, University of Arizona, USA
fYear
2015
Firstpage
136
Lastpage
142
Abstract
In this paper we present our recent results on iterative Gallager B decoder made of unreliable logic gates. We show evidence that probabilistic behavior of a decoder due to unreliable components can be exploited to our advantage and lead to an improved performance and reduced hardware redundancy. We provide examples of such decoder behavior and give an explanation of this phenomenon using iterative decoding dynamics. Iterative decoding can be viewed as a recursive procedure for Bethe free energy function minimization, and the randomness in a message update may help the decoder to escape from local minima. The decoder operates in a stochastic fashion, but the random perturbations do not require any additional hardware as they are built-in the faulty hardware itself.
Keywords
"Logic gates","Yttrium","Charge carrier processes"
Publisher
ieee
Conference_Titel
Information Theory and Applications Workshop (ITA), 2015
Type
conf
DOI
10.1109/ITA.2015.7308978
Filename
7308978
Link To Document