• DocumentCode
    3679004
  • Title

    Diode snappiness from a user´s perspective

  • Author

    Jorge Mari;Fabio Carastro;Max-Josef Kell;Peter Losee;Thomas Zoels

  • Author_Institution
    GE Global Research, Freisinger Landstr. 50, 85748 Garching b. Mü
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper deals with reverse recovery and snappiness in high voltage PiN diodes as the ones currently used in high power electronics applications. It suggests a practical quantitative definition for the occurrence of snappiness and investigates unusual phenomena that might occur during reverse recovery.
  • Keywords
    "Oscillators","Insulated gate bipolar transistors","Inductance","Voltage control","Damping","PIN photodiodes","Standards"
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications (EPE´15 ECCE-Europe), 2015 17th European Conference on
  • Type

    conf

  • DOI
    10.1109/EPE.2015.7309390
  • Filename
    7309390
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3679004