DocumentCode :
3679106
Title :
Reducing the Storage Requirements of a Set of Functional Test Sequences by Using a Background Sequence
Author :
Irith Pomeranz
Author_Institution :
Sch. of Electr. &
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
155
Lastpage :
160
Abstract :
An existing storage scheme for a functional test sequence T uses a vector B, called a background vector, to store only the differences between the test vectors of T and B. After selecting B, modifying T based on B reduces the storage requirements of T. This paper describes a storage scheme for a set of test sequences T that uses a test sequence B, called a background sequence, to store only the differences between the sequences in T and B. The use of a background sequence allows more flexibility in matching B to T. By selecting B from the sequences in T, storage of B does not increase the storage requirements of T, and B itself contributes to the fault coverage. The paper describes a procedure for selecting a background sequence B from a set of sequences T, and for modifying T (including B) in order to reduce the storage requirements of T.
Keywords :
"Circuit faults","Compaction","Clocks","Benchmark testing","System-on-chip","Computers","Encoding"
Publisher :
ieee
Conference_Titel :
VLSI (ISVLSI), 2015 IEEE Computer Society Annual Symposium on
Type :
conf
DOI :
10.1109/ISVLSI.2015.15
Filename :
7309555
Link To Document :
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