Title :
A self-adaptive blanking circuit for IGBT short-circuit protection based on VCE measurement
Author :
Xingyao Zhang;Min Chen;Nan Zhu;Dehong Xu
Author_Institution :
College of Electrical Engineering, Zhejiang University Hangzhou, China
Abstract :
In order to determine whether the IGBT short-circuit fault occurs, the collector-emitter voltage VCE of an IGBT has been detected in the IGBT gate drivers. The blanking circuit is needed in this kind of protection method to avoid the malfunction of the short-circuit protection during IGBT turn-on transient. However, this blanking circuit should be carefully designed for different types of IGBT modules. In order to make the IGBT short-circuit protection circuit suitable for the tolerance of IGBT modules, a self-adaptive blanking circuit combined with the aforementioned short-circuit protection method based on VCE measurement is proposed. The analysis of the proposed circuit is given, and the experimental results are included to prove the effectiveness of the proposed circuit.
Keywords :
"Blanking","Insulated gate bipolar transistors","Circuit faults","Integrated circuits","Voltage measurement","Logic gates","Delays"
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2015 IEEE
Electronic_ISBN :
2329-3748
DOI :
10.1109/ECCE.2015.7310242