DocumentCode
3679780
Title
A self-adaptive blanking circuit for IGBT short-circuit protection based on VCE measurement
Author
Xingyao Zhang;Min Chen;Nan Zhu;Dehong Xu
Author_Institution
College of Electrical Engineering, Zhejiang University Hangzhou, China
fYear
2015
Firstpage
4125
Lastpage
4131
Abstract
In order to determine whether the IGBT short-circuit fault occurs, the collector-emitter voltage VCE of an IGBT has been detected in the IGBT gate drivers. The blanking circuit is needed in this kind of protection method to avoid the malfunction of the short-circuit protection during IGBT turn-on transient. However, this blanking circuit should be carefully designed for different types of IGBT modules. In order to make the IGBT short-circuit protection circuit suitable for the tolerance of IGBT modules, a self-adaptive blanking circuit combined with the aforementioned short-circuit protection method based on VCE measurement is proposed. The analysis of the proposed circuit is given, and the experimental results are included to prove the effectiveness of the proposed circuit.
Keywords
"Blanking","Insulated gate bipolar transistors","Circuit faults","Integrated circuits","Voltage measurement","Logic gates","Delays"
Publisher
ieee
Conference_Titel
Energy Conversion Congress and Exposition (ECCE), 2015 IEEE
ISSN
2329-3721
Electronic_ISBN
2329-3748
Type
conf
DOI
10.1109/ECCE.2015.7310242
Filename
7310242
Link To Document