• DocumentCode
    3679780
  • Title

    A self-adaptive blanking circuit for IGBT short-circuit protection based on VCE measurement

  • Author

    Xingyao Zhang;Min Chen;Nan Zhu;Dehong Xu

  • Author_Institution
    College of Electrical Engineering, Zhejiang University Hangzhou, China
  • fYear
    2015
  • Firstpage
    4125
  • Lastpage
    4131
  • Abstract
    In order to determine whether the IGBT short-circuit fault occurs, the collector-emitter voltage VCE of an IGBT has been detected in the IGBT gate drivers. The blanking circuit is needed in this kind of protection method to avoid the malfunction of the short-circuit protection during IGBT turn-on transient. However, this blanking circuit should be carefully designed for different types of IGBT modules. In order to make the IGBT short-circuit protection circuit suitable for the tolerance of IGBT modules, a self-adaptive blanking circuit combined with the aforementioned short-circuit protection method based on VCE measurement is proposed. The analysis of the proposed circuit is given, and the experimental results are included to prove the effectiveness of the proposed circuit.
  • Keywords
    "Blanking","Insulated gate bipolar transistors","Circuit faults","Integrated circuits","Voltage measurement","Logic gates","Delays"
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2015 IEEE
  • ISSN
    2329-3721
  • Electronic_ISBN
    2329-3748
  • Type

    conf

  • DOI
    10.1109/ECCE.2015.7310242
  • Filename
    7310242