DocumentCode :
3679885
Title :
Static and dynamic performance assessment of commercial SiC MOSFET power modules
Author :
Muhammad Nawaz;Filippo Chimento;Kalle Ilves
Author_Institution :
ABB Corporate Research, Fö
fYear :
2015
Firstpage :
4899
Lastpage :
4906
Abstract :
This paper deals with static and dynamic measurements performed with full SiC MOSFET power modules. The voltage rating of the power modules is 1200 V and the current rating is 800 A. The on-resistances (RON) of the power modules were measured to be 6.0-10.0 mΩ, the measured blocking voltages were 1300-1400 V, and the threshold voltages were found to be around 3.0-3.5 V at 300 K. Evaluation of the dynamic performance has been carried out in a double-pulse tester with the use of commercially available gate drivers. A clean (i.e., almost oscillation and overshoot free) turn on and turn off transient behavior is obtained with negligible reverse recovery losses. The measured turn-on and turn-off losses at 800 V, 340 A, were 117 mJ and 40 mJ, respectively. With fixed supply voltage and load current, the energy-loss increases linearly with the gate resistance when varied from 2.5 to 20 mΩ. The energy losses remain insensitive with variation of temperature for a fixed supply voltage and current when tested up to the prescribed junction temperature of 150 °C.
Keywords :
"Logic gates","Silicon carbide","MOSFET","Multichip modules","Resistance","Inductance","Voltage measurement"
Publisher :
ieee
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2015 IEEE
ISSN :
2329-3721
Electronic_ISBN :
2329-3748
Type :
conf
DOI :
10.1109/ECCE.2015.7310351
Filename :
7310351
Link To Document :
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