• DocumentCode
    3680058
  • Title

    A high temperature de-saturation protection and under voltage lock out circuit for SiC MOSFET

  • Author

    Feng Qi;Longya Xu;Bo Zhao;Zhe Zhou

  • Author_Institution
    Dept. of Electrical and Computer Engineering, The Ohio State University Columbus, OH, USA
  • fYear
    2015
  • Firstpage
    6169
  • Lastpage
    6174
  • Abstract
    SiC devices have a great potential to work in high temperature (HT) environment. To protect SiC MOSFET in HT environment, this paper presents a de-saturation protection and under voltage lock out circuit using commercially available discrete transistors rated at 200°C. A discussion on integrated circuit (IC) solution and discrete circuit solution is presented to evaluate feasibility and benefit to design such a multifunctional circuit with discrete components. The prototype circuit is designed, built and tested in a thermal chamber of 180°C. To discuss the circuit operation principles in details, the circuit schematic is analyzed in functional blocks. To validate the circuit performance, experimental test is conducted at both room and high temperature conditions. No problem is found during accumulative 25 hours thermal chamber test at 180°C.
  • Keywords
    "Logic gates","Silicon carbide","Integrated circuits","Driver circuits","MOSFET","Capacitors"
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2015 IEEE
  • ISSN
    2329-3721
  • Electronic_ISBN
    2329-3748
  • Type

    conf

  • DOI
    10.1109/ECCE.2015.7310524
  • Filename
    7310524