DocumentCode
3680058
Title
A high temperature de-saturation protection and under voltage lock out circuit for SiC MOSFET
Author
Feng Qi;Longya Xu;Bo Zhao;Zhe Zhou
Author_Institution
Dept. of Electrical and Computer Engineering, The Ohio State University Columbus, OH, USA
fYear
2015
Firstpage
6169
Lastpage
6174
Abstract
SiC devices have a great potential to work in high temperature (HT) environment. To protect SiC MOSFET in HT environment, this paper presents a de-saturation protection and under voltage lock out circuit using commercially available discrete transistors rated at 200°C. A discussion on integrated circuit (IC) solution and discrete circuit solution is presented to evaluate feasibility and benefit to design such a multifunctional circuit with discrete components. The prototype circuit is designed, built and tested in a thermal chamber of 180°C. To discuss the circuit operation principles in details, the circuit schematic is analyzed in functional blocks. To validate the circuit performance, experimental test is conducted at both room and high temperature conditions. No problem is found during accumulative 25 hours thermal chamber test at 180°C.
Keywords
"Logic gates","Silicon carbide","Integrated circuits","Driver circuits","MOSFET","Capacitors"
Publisher
ieee
Conference_Titel
Energy Conversion Congress and Exposition (ECCE), 2015 IEEE
ISSN
2329-3721
Electronic_ISBN
2329-3748
Type
conf
DOI
10.1109/ECCE.2015.7310524
Filename
7310524
Link To Document