Title :
Soft recovery diodes with snappy behavior
Author :
Peter Losee;Max-Josef Kell;Fabio Carastro;Jorge Mari;Matthias Menzel;Tobias Schuetz;Thomas Zoels
Author_Institution :
GE Global Research, Niskayuna, NY 12309, USA
Abstract :
This paper illustrates several issues that a user of high voltage PiN diodes may encounter in actual application conditions. It shows that high-voltage power diodes require specifiable on-time prior to entering their reverse recovery phase and offers 1D device simulations and measurements taken on several actual high power diodes to illustrate and explain all the concepts introduced.
Keywords :
"Plasmas","Oscillators","PIN photodiodes","Silicon","Conductivity","Turning","Inductance"
Conference_Titel :
Power Electronics and Applications (EPE´15 ECCE-Europe), 2015 17th European Conference on
DOI :
10.1109/EPE.2015.7311692