DocumentCode
3680841
Title
Solid-state power converter repeatability analysis
Author
Anthony Dal Gobbo;Davide Aguglia
Author_Institution
CERN-European Organization for Nuclear Research, Technology Department, Electrical Power Converter group 1211 Geneva 23, Switzerland
fYear
2015
Firstpage
1
Lastpage
7
Abstract
This paper presents a method for evaluating power converter repeatability. The focus is on solid-state switch mode power converter for which the most problematic non-repeatability sources are the jitter of the drivers and of the switches leading to output voltage pulses bad repeatability. Both driver and switch turn-on and turn-off delay dispersion have been measured. These measurements confirm that the delay is Gaussian distributed and that the repeatability prediction method is valid.
Keywords
"Jitter","Switches","Voltage measurement","Insulated gate bipolar transistors","Delays","Pulse measurements","Semiconductor device measurement"
Publisher
ieee
Conference_Titel
Power Electronics and Applications (EPE´15 ECCE-Europe), 2015 17th European Conference on
Type
conf
DOI
10.1109/EPE.2015.7311694
Filename
7311694
Link To Document