• DocumentCode
    3680841
  • Title

    Solid-state power converter repeatability analysis

  • Author

    Anthony Dal Gobbo;Davide Aguglia

  • Author_Institution
    CERN-European Organization for Nuclear Research, Technology Department, Electrical Power Converter group 1211 Geneva 23, Switzerland
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper presents a method for evaluating power converter repeatability. The focus is on solid-state switch mode power converter for which the most problematic non-repeatability sources are the jitter of the drivers and of the switches leading to output voltage pulses bad repeatability. Both driver and switch turn-on and turn-off delay dispersion have been measured. These measurements confirm that the delay is Gaussian distributed and that the repeatability prediction method is valid.
  • Keywords
    "Jitter","Switches","Voltage measurement","Insulated gate bipolar transistors","Delays","Pulse measurements","Semiconductor device measurement"
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications (EPE´15 ECCE-Europe), 2015 17th European Conference on
  • Type

    conf

  • DOI
    10.1109/EPE.2015.7311694
  • Filename
    7311694