• DocumentCode
    3680906
  • Title

    A comprehensive investigation on the short circuit performance of MW-level IGBT power modules

  • Author

    Rui Wu;Paula Diaz Reigosa;Francesco Iannuzzo;Huai Wang;Frede Blaabjerg

  • Author_Institution
    Aalborg University, Pontoppidanstraede 101, Aalborg, Denmark
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    This paper investigates the short circuit performance of commercial 1.7 kV / 1 kA IGBT power modules by means of a 6 kA Non-Destructive-Tester. A mismatched current distribution among the parallel chips has been observed, which can reduce the short circuit capability of the IGBT power module under short circuit conditions. Further Spice simulations reveal that the stray parameters inside the module play an important role in contributing to such a phenomenon.
  • Keywords
    "Insulated gate bipolar transistors","Multichip modules","Logic gates","Current distribution","Short-circuit currents","Inductance","Transient analysis"
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications (EPE´15 ECCE-Europe), 2015 17th European Conference on
  • Type

    conf

  • DOI
    10.1109/EPE.2015.7311761
  • Filename
    7311761
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3680906