Title :
A comprehensive ESD verification flow at transistor level for large SoC designs
Author :
Jérôme Lescot;Patrice Dehan;Wahbi Boujarra;Dina Medhat;Sophie Billy
Author_Institution :
STMicroelectronics, 850 rue Jean Monnet, Crolles, 38920, France
Abstract :
A fast yet robust multi-domain ESD verification flow at transistor level has been developed for large SoC designs. All steps of the verification process from initial power domains configuration to the final debugging process are covered in this comprehensive solution that supports scalable ESD protection structures.
Keywords :
"Electrostatic discharges","SPICE","Layout","Topology","Transistors","Engines","System-on-chip"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314740