DocumentCode :
3683112
Title :
Air-discharge testing of single components
Author :
Hans-Martin Ritter;Lars Koch;Mark Schneider;Guido Notermans
Author_Institution :
NXP Semiconductors Germany GmbH, Stresemannallee 101, 22529 Hamburg, Germany
fYear :
2015
Firstpage :
1
Lastpage :
7
Abstract :
The set-up for air discharge ESD testing on single components has been systematically investigated. Excellent repeatability can be achieved with an optimized set-up. The first peak is missing due to long risetimes. Surprisingly, the total charge in an air discharge pulse is larger than in a contact discharge.
Keywords :
"Discharges (electric)","Sparks","Current measurement","Capacitance","Electrostatic discharges","Antennas","Shape"
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
Type :
conf
DOI :
10.1109/EOSESD.2015.7314748
Filename :
7314748
Link To Document :
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