DocumentCode :
3683140
Title :
Active clamp design for on-chip GUN protection
Author :
Andreas Rupp;Ulrich Glaser;Yiqun Cao
Author_Institution :
Infineon Technologies AG, Am Campeon 1-12, 85579, Neubiberg, Germany
fYear :
2015
Firstpage :
1
Lastpage :
6
Abstract :
On-chip active clamps show attractive performance for the component-level ESD protection like HBM, but suffer usually from their weakness for short-pulse and high-current events like the first peak of IEC 61000-4-2 (GUN) pulses. This disadvantage can be overcome by adequate active clamp design, resulting in an area efficient active clamp GUN protection.
Keywords :
"Clamps","Electrostatic discharges","Logic gates","Robustness","Transient analysis","Capacitance","System-on-chip"
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
Type :
conf
DOI :
10.1109/EOSESD.2015.7314778
Filename :
7314778
Link To Document :
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