• DocumentCode
    3683146
  • Title

    CDM-reliable T-coil techniques for high-speed wireline receivers

  • Author

    Min-Sun Keel;Elyse Rosenbaum

  • Author_Institution
    Dept. of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 61801, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    An inherent CDM hazard exists in T-coil circuits due to magnetic coupling. An “inductance halving” technique is proposed to reduce magnetic coupling during ESD. From simulation, the proposed solution can effectively suppress voltage overshoot and minimize bandwidth degradation, compared to the conventional secondary ESD protection.
  • Keywords
    "Electrostatic discharges","Receivers","Bandwidth","Inductance","Parasitic capacitance","Resistors","Couplings"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314784
  • Filename
    7314784
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683146