Title :
CDM-reliable T-coil techniques for high-speed wireline receivers
Author :
Min-Sun Keel;Elyse Rosenbaum
Author_Institution :
Dept. of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 61801, USA
Abstract :
An inherent CDM hazard exists in T-coil circuits due to magnetic coupling. An “inductance halving” technique is proposed to reduce magnetic coupling during ESD. From simulation, the proposed solution can effectively suppress voltage overshoot and minimize bandwidth degradation, compared to the conventional secondary ESD protection.
Keywords :
"Electrostatic discharges","Receivers","Bandwidth","Inductance","Parasitic capacitance","Resistors","Couplings"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314784
