• DocumentCode
    3683147
  • Title

    ESD induced functional upset in magnetic sensor ICs

  • Author

    Donald Dibra;Kai Esmark;Stefan Jahn;Mario Motz

  • Author_Institution
    Infineon Technologies AG, 85579 Neubiberg, Germany
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper discusses the functional upset behavior of magnetic sensor ICs for automotive applications during ESD system level tests according to the ISO 10605 standard. The system level ESD functional upset robustness is presented for two different sensors, one with and one without a supply voltage drop capability (μ-short functionality).
  • Keywords
    "Stress","Electrostatic discharges","Magnetic sensors","Discharges (electric)","Sensor systems","Magnetomechanical effects"
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
  • Type

    conf

  • DOI
    10.1109/EOSESD.2015.7314785
  • Filename
    7314785
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3683147