Title :
ESD induced functional upset in magnetic sensor ICs
Author :
Donald Dibra;Kai Esmark;Stefan Jahn;Mario Motz
Author_Institution :
Infineon Technologies AG, 85579 Neubiberg, Germany
Abstract :
This paper discusses the functional upset behavior of magnetic sensor ICs for automotive applications during ESD system level tests according to the ISO 10605 standard. The system level ESD functional upset robustness is presented for two different sensors, one with and one without a supply voltage drop capability (μ-short functionality).
Keywords :
"Stress","Electrostatic discharges","Magnetic sensors","Discharges (electric)","Sensor systems","Magnetomechanical effects"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314785
