Title :
Versatile models and expanded application of the IEC 61000-4-2 test
Author :
Timothy J. Maloney
Author_Institution :
Intel Corporation, SC9-09, 2200 Mission College Blvd. Santa Clara, CA 95052 USA
Abstract :
An all-purpose circuit model and associated shorting current waveform expression for the IEC 61000-4-2 pulse is presented. Criteria include agreement with existing IEC guidance plus zero field derivative at t=0, for accurate radiation modeling. Also, a capacitive coupling tool for IEC pulsers is used to simulate platform I/O port hazards.
Keywords :
"Integrated circuit modeling","Hidden Markov models","IEC","IEC Standards","Capacitance","Couplings","Analytical models"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314788
