Title :
Practical methodology for the extraction of SEED models
Author :
Collin Reiman;Nicholas Thomson;Yang Xiu;Robert Mertens;Elyse Rosenbaum
Author_Institution :
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 1308 W. Main St., 61801 USA
Abstract :
A custom test board facilitates TLP characterization of the external pins of an integrated circuit. Models extracted from the data are used to simulate the pin-level response of the IC to an IEC 61000-4-2 discharge. ESD gun zaps are applied to the test board; simulated and measured waveforms are compared.
Keywords :
"Pins","Current measurement","Voltage measurement","Semiconductor device measurement","Transmission line measurements","Electrostatic discharges","Pulse measurements"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314789
