DocumentCode
3683156
Title
A low-impedance TLP measurement system for power semiconductor characterization up to 700V and 400A in the microsecond range
Author
Gabriel Cretu;Marius Cenusa;Martin Pfost;Kevni Büyüktas;Uwe Wahl
Author_Institution
Robert Bosch Center for Power Electronics, Reutlingen University, Alteburgstr. 150, 72762, Germany
fYear
2015
Firstpage
1
Lastpage
7
Abstract
A TLP system with a very low characteristic impedance of 1.5Ω and a selectable pulse length from 0.5 to 6 μs is presented. It covers the entire operation region of many power semiconductors up to 700V and 400 A. Its applicability is demonstrated by determining the output characteristics for two CoolMOS devices up to destruction.
Keywords
"Chlorine","Irrigation","Switches","Integrated circuits"
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
Type
conf
DOI
10.1109/EOSESD.2015.7314794
Filename
7314794
Link To Document