Title :
Practical HBM testing with statistical pin combinations
Author :
Wolfgang Stadler;Josef Niemesheim;Huelya Guerses;Oliver Hilbricht;Andrea Boroni;Giuseppe Ballarin;Evan Grund
Author_Institution :
Intel Mobile Communications, Am Campeon 10-12, D-85579 Neubiberg, Germany
Abstract :
Instead of using a pin group approach as defined in the current HBM standard JS-001, stressing statistically determined pin pairs can drastically reduce the stress count and the stress time. The correlation of different HBM test methods is discussed with different examples, proving the wide applicability of this approach.
Keywords :
"Stress","Pins","Testing","Electrostatic discharges","Qualifications","Integrated circuits","Standards"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314801
