Title :
S-parameter based modeling of system-level ESD test bed
Author :
Yang Xiu;Nicholas Thomson;Robert Mertens;Elyse Rosenbaum
Author_Institution :
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, 61801 USA
Abstract :
The IEC 61000-4-2 test bed is modeled with circuit elements extracted from S-parameter measurements. Simulated current waveforms are consistent with measurement for both battery operated and tethered equipment-under-test without customizing the model parameters for each case.
Keywords :
"Current measurement","Discharges (electric)","Integrated circuit modeling","Electrostatic discharges","Computational modeling","Scattering parameters","Data models"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314803
