Title :
Debug and prediction of EOS events using long duration Transmission Line Pulse (TLP) measurements
Author :
Dave Clarke;Stephen Heffernan
Author_Institution :
Analog Devices Intl, Raheen Business Park, Limerick, Ireland
Abstract :
This case study demonstrates how long-duration Transmission Line Pulse (TLP) measurements can be used to debug, replicate and even predict EOS events. Knowing the EOS waveform characteristics allows easier determination of the root cause of the electrical overstress. This is critical in preventing future such occurrences.
Keywords :
"Thyristors","Earth Observing System","Electrostatic discharges","Power supplies","Rails","Stress","Metals"
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2015 37th
DOI :
10.1109/EOSESD.2015.7314804
