Title :
A CMOS ripple detector for integrated voltage regulator testing
Author :
Cagatay Ozmen;Aydin Dirican;Nurettin Tan;Hieu Nguyen;Martin Margala
Author_Institution :
Department of Electrical and Computer Engineering, University of Massachusetts Lowell, USA
Abstract :
This paper will present an RMS based ripple sensor for testing of fully integrated voltage regulators. A DC signal which is proportional to the input ripple amplitude is generated. Final digital pass/fail signal is obtained with a clocked comparator. The sensor can detect a peak-to-peak ripple voltage of up to 50 millivolts on the 1.2 volts supply rail and has 220 MHz bandwidth. The sensor is designed using IBM 90 nm CMOS technology and its functionality is verified in Cadence Virtuoso simulation environment.
Keywords :
"Fault tolerance","Fault tolerant systems","Very large scale integration","Nanotechnology","Discrete Fourier transforms","Decision support systems","Hafnium"
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), 2015 IEEE International Symposium on
DOI :
10.1109/DFT.2015.7315152
