Multi-domain characterization of semiconductor devices

Today thermal issues are among the main bottlenecks of microelectronics and solid-state lighting. Mitigation to thermal problems of ICs is provided either by new, more efficient cooling technologies or by thermal aware design tools, including electro-thermal or logi-thermal simulation. In solid-state lighting the situation is somewhat similar: replacement of high-intensity discharge lamps is still hampered by cooling problems. In case of LEDs not only the thermal and electrical operation of the diode is to be modeled and simulated - the electro-thermal behavior also needs to be tightly coupled to modeling and simulation of the light output, hence, a real multi-domain characterization from measurements on component level to simulation on system level is required. This paper aims to provide an overview of measurement, modeling and simulation techniques in which the semiconductor devices are characterized in all of their relevant operating domains in a self-consistent way.