Title :
THZ characterization of painting layers
Author :
I. Cacciari;D. Ciofini;S. Siano
Author_Institution :
Ist. di Fis. Appl. “
fDate :
5/1/2015 12:00:00 AM
Abstract :
A THz Time Domain spectrometer was used to investigate painting layers in reflection geometry. The stratified layers were characterized and the refractive indexes were measured. The results were used for estimating the thicknesses of superimposed paint layers.
Conference_Titel :
Fotonica AEIT Italian Conference on Photonics Technologies, 2015
Print_ISBN :
978-1-78561-068-4
DOI :
10.1049/cp.2015.0170
