Innovative data treatment routines for atomic force microscopy force curves

The atomic force microscopy (AFM) is an important innovation in the sample imaging fields, the signals extracted from the AFM such as the force as function of the indentation and the friction as function of the indentation can be used to extract many chemical and mechanical properties of the sample. Nanoscientists analyze these signals manually; the aim of this article is to find new algorithms to automatically analyze AFM signals.