DocumentCode
3688081
Title
Surface passivation in self-induced junction Si photodiodes
Author
Pekka T. Neuvonen;Edouard Monakhov; Chi Kwong Tang;Jarle Gran;Toomas Kübarsepp
Author_Institution
Department of Physics/SMN, University of Oslo, P.O.Box 1048 Blindern, N-0316, Norway
fYear
2015
Firstpage
427
Lastpage
428
Abstract
The effects of chemical and electrical passivation in self-induced junction photodiodes have been studied. By employing experimental methods and simulations, it is shown that chemical passivation dominates over electrical passivation in this type of photodiodes.
Keywords
"Junctions","Photodiodes","Cleaning","Passivation","Monitoring","Radiative recombination","Europe"
Publisher
ieee
Conference_Titel
Photonics Conference (IPC), 2015
ISSN
1092-8081
Type
conf
DOI
10.1109/IPCon.2015.7323514
Filename
7323514
Link To Document