DocumentCode
3688168
Title
Dispersion properties of bent silicon nitride waveguides
Author
Kentaro Furusawa;Norihiko Sekine;Akifumi Kasamatsu;Yoshinori Uzawa
Author_Institution
National Institute of Information and Communications Technology (NICT), Koganei, Japan
fYear
2015
Firstpage
359
Lastpage
360
Abstract
We discuss the dispersion properties of silicon nitride waveguides by taking into account the effect of bending, as relevant to microring resonators. Material dispersion characterized by near-infrared spectroscopic ellipsometry is also presented.
Keywords
"Ellipsometry","Silicon nitride","Optimization"
Publisher
ieee
Conference_Titel
Photonics Conference (IPC), 2015
ISSN
1092-8081
Type
conf
DOI
10.1109/IPCon.2015.7323613
Filename
7323613
Link To Document