DocumentCode :
3688207
Title :
0.5–1.3 µm III-nitride lasers and light emitting diodes epitaxially grown on (001) silicon
Author :
Arnab Hazari;Aniruddha Bhattacharya;Thomas Frost;Pallab Bhattacharya
Author_Institution :
Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, 48109-2122, United States
fYear :
2015
Firstpage :
563
Lastpage :
564
Abstract :
We have recently demonstrated electrically pumped 530nm (green) and 615nm (red) InGaN/GaN disk-in-nanowire (DNW) monolithic edge-emitting lasers on (001) silicon substrates. The nanowire heterostructures were grown by molecular beam epitaxy (MBE). These are the only lasers directly grown on (001) silicon without any substrate tilt or intermediate buffers. The lasers have demonstrated excellent steady state (Jth ~ 2kA/cm2, T0 ~ 240K, dg/dn ~ 3×10-17cm2) and dynamic (small-signal modulation bandwidth ~ 4GHz) characteristics and a lifetime ~ 7000hrs. In this study we have extended the emission wavelength from the DNW to 1.46μm, the longest emission wavelength of a monolithic epitaxially grown heterostructure on silicon. Nanowire light-emitting diodes with peak emission at λ = 1.3μm are demonstrated for the first time. The epitaxy of the InGaN/GaN DNW and the long wavelength light sources are described.
Keywords :
"Light emitting diodes","Wavelength measurement","Silicon","Gallium nitride","Temperature measurement","Scanning electron microscopy","Substrates"
Publisher :
ieee
Conference_Titel :
Photonics Conference (IPC), 2015
ISSN :
1092-8081
Type :
conf
DOI :
10.1109/IPCon.2015.7323655
Filename :
7323655
Link To Document :
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