• DocumentCode
    3689003
  • Title

    Fast high power capacitive RF-MEMS switch for X-Band applications

  • Author

    A. Ziaei;S. Bansropun;P. Martins;M. Le Baillif

  • Author_Institution
    Group de Recherche Technologies et Mesures, Thales Research &
  • fYear
    2015
  • Firstpage
    153
  • Lastpage
    155
  • Abstract
    This paper presents a thin film metallic membrane (~1μm) capacitive RF-MEMS shunt switch with a power handling of more than 20 W for X-Band applications. The device switching time is below 15 μs, in cold switching, for a 60 V applied voltage. The up-state capacitance is 40 fF, resulting in a less than 0.1 dB insertion losses at 10 GHz, simulated. The down-state capacitance, estimated at 3.1 pF, including the parasitic air capacitance from the surface roughness, results in a 77 capacitance ration for about 30 dB isolation, simulated. Measurements show up to a million cycles with no degradation on performances under 20W incident power in cold switching.
  • Keywords
    "Optical switches","Radio frequency","Substrates","Capacitance","Atmospheric measurements","Temperature measurement"
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference (ESSDERC), 2015 45th European
  • ISSN
    1930-8876
  • Print_ISBN
    978-1-4673-7133-9
  • Electronic_ISBN
    2378-6558
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2015.7324736
  • Filename
    7324736