DocumentCode
3689003
Title
Fast high power capacitive RF-MEMS switch for X-Band applications
Author
A. Ziaei;S. Bansropun;P. Martins;M. Le Baillif
Author_Institution
Group de Recherche Technologies et Mesures, Thales Research &
fYear
2015
Firstpage
153
Lastpage
155
Abstract
This paper presents a thin film metallic membrane (~1μm) capacitive RF-MEMS shunt switch with a power handling of more than 20 W for X-Band applications. The device switching time is below 15 μs, in cold switching, for a 60 V applied voltage. The up-state capacitance is 40 fF, resulting in a less than 0.1 dB insertion losses at 10 GHz, simulated. The down-state capacitance, estimated at 3.1 pF, including the parasitic air capacitance from the surface roughness, results in a 77 capacitance ration for about 30 dB isolation, simulated. Measurements show up to a million cycles with no degradation on performances under 20W incident power in cold switching.
Keywords
"Optical switches","Radio frequency","Substrates","Capacitance","Atmospheric measurements","Temperature measurement"
Publisher
ieee
Conference_Titel
Solid State Device Research Conference (ESSDERC), 2015 45th European
ISSN
1930-8876
Print_ISBN
978-1-4673-7133-9
Electronic_ISBN
2378-6558
Type
conf
DOI
10.1109/ESSDERC.2015.7324736
Filename
7324736
Link To Document