Title :
A THz measurement platform design for 0.2–1.1THz
Author :
Haotian Zhu;Quan Xue
Author_Institution :
State Key Laboratory of Millimeter Waves, Department of Electronic Engineering, and CityU Shenzhen Research Institute, City University of Hong Kong, Hong Kong
Abstract :
A precise and stable THz Measurement Platform is proposed in this paper. The displacement precision and angle precision of the platform are 0.02mm and 1° respectively. With OML or VDI extension module and Agilent N5245A PNA-X network analyzer, the THz Measurement Platform can measure waveguide components and antennas precisely in 0.2-1.1THz.
Keywords :
"Antenna measurements","Millimeter wave measurements","Steel","Optical waveguides","Antenna accessories","Metrology"
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2015 40th International Conference on
Electronic_ISBN :
2162-2035
DOI :
10.1109/IRMMW-THz.2015.7327432
