• DocumentCode
    3692766
  • Title

    AYUSH: Extending Lifetime of SRAM-NVM Way-Based Hybrid Caches Using Wear-Leveling

  • Author

    Sparsh Mittal;Jeffrey S. Vetter

  • Author_Institution
    Oak Ridge Nat. Lab., Oak Ridge, TN, USA
  • fYear
    2015
  • Firstpage
    112
  • Lastpage
    121
  • Abstract
    The features and limitations of both SRAM and NVM (non-volatile memory) technologies have led the researchers to study SRAM-NVM way-based hybrid last level caches (LLCs). Since large leakage power consumption of SRAM allows including only few SRAM ways, the small write-endurance of NVM may still lead to small lifetime of these hybrid caches. We propose AYUSH, a technique for improving lifetime of SRAM-NVM hybrid caches. AYUSH uses data-migration approach to preferentially utilize SRAM for storing write-intensive data. Microarchitectural simulations have shown that AYUSH provides larger improvement in lifetime than three previous techniques. For single, dual and quad-core system configurations, the average increase in cache lifetime with AYUSH is 6.90×, 24.06× and 47.62×, respectively. Also, it does not harm performance or energy efficiency and works well for a range of system and algorithm parameters.
  • Keywords
    "Random access memory","Nonvolatile memory","Program processors","Memory management","Radiation detectors","Computational modeling","Analytical models"
  • Publisher
    ieee
  • Conference_Titel
    Modeling, Analysis and Simulation of Computer and Telecommunication Systems (MASCOTS), 2015 IEEE 23rd International Symposium on
  • ISSN
    1526-7539
  • Type

    conf

  • DOI
    10.1109/MASCOTS.2015.29
  • Filename
    7330180