DocumentCode :
3697252
Title :
[Title page]
fYear :
2015
fDate :
7/1/2015 12:00:00 AM
Firstpage :
1
Lastpage :
1
Abstract :
The following topics are dealt with: FPGA; single event upset; SoC; SOI flip-flops; spacecraft electronics; single event effect; power MOSFETs; SDRAM; optocouplers; total ionizing dose radiation; MEMS-oscillators; and CMOS processor.
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
Type :
conf
DOI :
10.1109/REDW.2015.7336696
Filename :
7336696
Link To Document :
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