Title :
Compendium of Current Total Ionizing Dose and Displacement Damage for Candidate Spacecraft Electronics for NASA
Author :
Michael J. Campola;Donna J. Cochran;Alvin J. Boutte;Dakai Chen;Robert A. Gigliuto;Kenneth A. LaBel;Jonathan A. Pellish;Raymond L. Ladbury;Megan C. Casey;Edward P. Wilcox;Martha V. O´Bryan;Jean-Marie Lauenstein;Dan Violette;Michael A. Xapsos
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
Total ionizing dose and displacement damage testing is performed to characterize and determine the suitability of candidate electronics for NASA spacecraft and program use.
Keywords :
"Degradation","Electronic mail","Transistors","Protons","Operational amplifiers","NASA","Green products"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336705
