Title :
Heavy Ion Single Event Effects Measurements of Xilinx Zynq-7000 FPGA
Author :
Mehran Amrbar;Farokh Irom;Steven M. Guertin;Greg Allen
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
Heavy ion single-event effect (SEE) measurements on Xilinx Zynq-7000 are reported. Heavy ion susceptibility to Single-Event latchup (SEL), single event upsets (SEUs) of BRAM, configuration bits of FPGA and on chip memory (OCM) of the processor were investigated.
Keywords :
"Field programmable gate arrays","Software","Testing","Registers","Single event upsets","Logic gates","Radiation effects"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336714
