• DocumentCode
    3697278
  • Title

    Neutron SEE Testing of the 65nm SmartFusion2 Flash-Based FPGA

  • Author

    Durwyn Dsilva;Jih-Jong Wang;Nadia Rezzak;Narayan Jat

  • Author_Institution
    Microsemi SOC, San Jose, CA, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    SmartFusion2 Flash-based Reprogrammable FPGAs are Neutron beam tested. Results confirm immunity of SEL and configuration upset with an elevated temperature approximately 95 oC. SEU is discussed for the Fabric Logic, Global logic, SRAM, PLL and SEFI on the MSS.
  • Keywords
    "Phase locked loops","Random access memory","Field programmable gate arrays","Testing","Single event upsets","Clocks","Fabrics"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336722
  • Filename
    7336722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697278