Title :
Neutron SEE Testing of the 65nm SmartFusion2 Flash-Based FPGA
Author :
Durwyn Dsilva;Jih-Jong Wang;Nadia Rezzak;Narayan Jat
Author_Institution :
Microsemi SOC, San Jose, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
SmartFusion2 Flash-based Reprogrammable FPGAs are Neutron beam tested. Results confirm immunity of SEL and configuration upset with an elevated temperature approximately 95 oC. SEU is discussed for the Fabric Logic, Global logic, SRAM, PLL and SEFI on the MSS.
Keywords :
"Phase locked loops","Random access memory","Field programmable gate arrays","Testing","Single event upsets","Clocks","Fabrics"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336722
