Title :
Neutron, 64 MeV Proton, Thermal Neutron and Alpha Single-Event Upset Characterization of Xilinx 20nm UltraScale Kintex FPGA
Author :
Pierre Maillard;Michael Hart;Jeff Barton;Praful Jain;James Karp
Author_Institution :
Xilinx Inc., San Jose, CA, USA
fDate :
7/1/2015 12:00:00 AM
Abstract :
The single-event response of Xilinx 20nm UltraScale Kintex FPGA is characterized using neutron, 64 MeV proton, thermal neutron and alpha foil irradiation sources. Single-event upset and multi-bits upset results are presented.
Keywords :
"Neutrons","Protons","Field programmable gate arrays","Testing","Particle beams","Single event upsets","Real-time systems"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336723
