Title :
Preliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor / System-on-a-Chip
Author :
Carl M. Szabo;Adam Duncan;Kenneth A. LaBel;Matt Kay;Pat Bruner;Mike Krzesniak;Lei Dong
Author_Institution :
ASRC Fed. Space &
fDate :
7/1/2015 12:00:00 AM
Abstract :
Hardness assurance test results of Intel state-of-the-art 14nm "Broadwell" U-series processor / System-on-a-Chip (SoC) for total ionizing dose (TID) are presented, along with exploratory results from trials at a medical proton facility. Test method builds upon previous efforts by utilizing commercial laptop motherboards and software stress applications as opposed to more traditional automated test equipment (ATE).
Keywords :
"Stress","Fixtures","Testing","Protons","Software","Heating","Batteries"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336725