• DocumentCode
    3697281
  • Title

    Preliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor / System-on-a-Chip

  • Author

    Carl M. Szabo;Adam Duncan;Kenneth A. LaBel;Matt Kay;Pat Bruner;Mike Krzesniak;Lei Dong

  • Author_Institution
    ASRC Fed. Space &
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Hardness assurance test results of Intel state-of-the-art 14nm "Broadwell" U-series processor / System-on-a-Chip (SoC) for total ionizing dose (TID) are presented, along with exploratory results from trials at a medical proton facility. Test method builds upon previous efforts by utilizing commercial laptop motherboards and software stress applications as opposed to more traditional automated test equipment (ATE).
  • Keywords
    "Stress","Fixtures","Testing","Protons","Software","Heating","Batteries"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336725
  • Filename
    7336725