Title :
Radiation Effects Characterization of a 3.125Gbps 90nm SerDes IP
Author :
Anthony Wilson;Sasko Zarev;Mark Kazmier
fDate :
7/1/2015 12:00:00 AM
Abstract :
This work presents and discusses a 3.125 Gbps serializer-deserializer (SerDes) IP fabricated in a 90nm technology which has been characterized for total ionizing dose (TID), single-event upset (SEU), and single-event latchup (SEL).
Keywords :
"Phase locked loops","Bit error rate","Oscilloscopes","Radiation effects","Clocks","Xenon","Synchronization"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336728
