• DocumentCode
    3697289
  • Title

    SET and SEFI Characterization of the 65 nm SmartFusion2 Flash-Based FPGA under Heavy Ion Irradiation

  • Author

    Nadia Rezzak;Durwyn Dsilva;Jih-Jong Wang;Narayan Jat

  • Author_Institution
    Microsemi SOC, San Jose, CA, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    SET and SEFI characterization of the SmartFusion2 flash-based FPGA under heavy ion irradiation is presented. Functional blocks such as the PLL and Microcontroller Sub System are characterized and presented.
  • Keywords
    "Phase locked loops","Fabrics","Flip-flops","Field programmable gate arrays","Clocks","Microcontrollers","Testing"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336733
  • Filename
    7336733
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697289