• DocumentCode
    3697295
  • Title

    TID and SEE Characterization of Microsemi´s 4th Generation Radiation Tolerant RTG4 Flash-Based FPGA

  • Author

    Nadia Rezzak;Jih-Jong Wang;Durwyn Dsilva;Narayan Jat

  • Author_Institution
    Microsemi SOC, San Jose, CA, USA
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    TID and SEE characterization of Microsemi´s 4th generation RTG4 flash-based FPGA is presented. The radiation performance of RTG4 is compared to SmartFusion2, Microsemi´s 4th generation commercial flash-based FPGA.
  • Keywords
    "Field programmable gate arrays","Random access memory","Transistors","Threshold voltage","Power supplies","Switching circuits","Logic gates"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336739
  • Filename
    7336739
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3697295