Title :
Vanderbilt Pelletron - Low Energy Protons and Other Ions for Radiation Effects on Electronics
Author :
Michael W. McCurdy;Marcus H. Mendenhall;Robert A. Reed;Bridget R. Rogers;Robert A. Weller;Ronald D. Schrimpf
Author_Institution :
Inst. for Space &
fDate :
7/1/2015 12:00:00 AM
Abstract :
Vanderbilt University School of Engineering´s Pelletron has been used to conduct single event effects, displacement damage and total ionizing dose testing on electronics and materials. A custom vacuum chamber with adjustable stage and various feedthroughs facilitate testing. Beam scattering using thin gold foils provide good beam uniformity over approximately 1 inch diameter. Over 25 peer reviewed papers have been published that include results from tests performed. External users are invited to use this facility.
Keywords :
"Protons","Radiation effects","Gold","Detectors","Phosphors","Single event upsets"
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN :
978-1-4673-7641-9
DOI :
10.1109/REDW.2015.7336741