DocumentCode
3697297
Title
Vanderbilt Pelletron - Low Energy Protons and Other Ions for Radiation Effects on Electronics
Author
Michael W. McCurdy;Marcus H. Mendenhall;Robert A. Reed;Bridget R. Rogers;Robert A. Weller;Ronald D. Schrimpf
Author_Institution
Inst. for Space &
fYear
2015
fDate
7/1/2015 12:00:00 AM
Firstpage
1
Lastpage
6
Abstract
Vanderbilt University School of Engineering´s Pelletron has been used to conduct single event effects, displacement damage and total ionizing dose testing on electronics and materials. A custom vacuum chamber with adjustable stage and various feedthroughs facilitate testing. Beam scattering using thin gold foils provide good beam uniformity over approximately 1 inch diameter. Over 25 peer reviewed papers have been published that include results from tests performed. External users are invited to use this facility.
Keywords
"Protons","Radiation effects","Gold","Detectors","Phosphors","Single event upsets"
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop (REDW), 2015 IEEE
Print_ISBN
978-1-4673-7641-9
Type
conf
DOI
10.1109/REDW.2015.7336741
Filename
7336741
Link To Document