• DocumentCode
    3697297
  • Title

    Vanderbilt Pelletron - Low Energy Protons and Other Ions for Radiation Effects on Electronics

  • Author

    Michael W. McCurdy;Marcus H. Mendenhall;Robert A. Reed;Bridget R. Rogers;Robert A. Weller;Ronald D. Schrimpf

  • Author_Institution
    Inst. for Space &
  • fYear
    2015
  • fDate
    7/1/2015 12:00:00 AM
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Vanderbilt University School of Engineering´s Pelletron has been used to conduct single event effects, displacement damage and total ionizing dose testing on electronics and materials. A custom vacuum chamber with adjustable stage and various feedthroughs facilitate testing. Beam scattering using thin gold foils provide good beam uniformity over approximately 1 inch diameter. Over 25 peer reviewed papers have been published that include results from tests performed. External users are invited to use this facility.
  • Keywords
    "Protons","Radiation effects","Gold","Detectors","Phosphors","Single event upsets"
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2015 IEEE
  • Print_ISBN
    978-1-4673-7641-9
  • Type

    conf

  • DOI
    10.1109/REDW.2015.7336741
  • Filename
    7336741