DocumentCode :
36982
Title :
Degradation Behavior of Flexible a-Si/a-SiGe/a-SiGe Triple-Junction Solar Cells Irradiated With Protons
Author :
Sato, Shin-ichiro ; Beernink, Kevin ; Ohshima, T.
Author_Institution :
Japan Atomic Energy Agency, Takasaki, Japan
Volume :
3
Issue :
4
fYear :
2013
fDate :
Oct. 2013
Firstpage :
1415
Lastpage :
1422
Abstract :
Electrical performance degradation of a-Si/a-SiGe/a-SiGe triple-junction solar cells due to irradiation of protons with different energies and their performance recovery at room temperature (RT) just after irradiation are reported. The current-voltage characteristics are measured in situ, and the results show that all the parameters recover with time after proton irradiation is stopped. The degradation is scaled by a unit of displacement damage dose independent of proton energy, indicating that the proton-induced degradation is mainly caused by the displacement damage effects. By analyzing the quantum efficiency variations due to irradiation, it is clarified that the top subcell recovers more markedly at RT than the other subcells, and the recovery of the middle cell is less pronounced.
Keywords :
Ge-Si alloys; elemental semiconductors; proton effects; semiconductor junctions; silicon; solar cells; Si-SiGe; current-voltage characteristics; degradation behavior; displacement damage dose; displacement damage effects; electrical performance degradation; flexible a-Si/a-SiGe/a-SiGe triple-junction solar cells; middle cell recovery; performance recovery; proton energy; proton irradiation; proton-induced degradation; quantum efficiency variations; top subcell; Amorphous semiconductors; Annealing; Degradation; Ion radiation effects; Photovoltaic cells; Proton effects; Radiation hardening (electronics); Amorphous semiconductors; ion radiation effects; photovoltaic cells; proton effects; radiation hardening;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2013.2271672
Filename :
6558813
Link To Document :
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