DocumentCode
3698496
Title
Design considerations of HBM stacked DRAM and the memory architecture extension
Author
Dong Uk Lee;Kang Seol Lee;Yongwoo Lee;Kyung Whan Kim;Jong Ho Kang;Jaejin Lee;Jun Hyun Chun
Author_Institution
SK Hynix, Icheon, Korea
fYear
2015
Firstpage
1
Lastpage
8
Abstract
Recently, the 3D stacked memory, which is known as HBM (high bandwidth memory), using TSV process has been developed. The stacked memory structure provides increased bandwidth, low power consumption, as well as small form factor. There are many design challenges, such as multi-channel operation, microbump test and TSV connection scan. Various design methodology make it possible to overcome the difficulties in the development of TSV technology. Vertical stacking enables more diverse memory architecture than the flat architecture. The next generation of HBM focuses on not only the bandwidth but also the system performance enhancement by adopting pseudo channel and 8-Hi stacking. The architecture applied to the second generation HBM are introduced in this paper.
Keywords
"Random access memory","Bandwidth","Stacking","Assembly","Registers","Resistance","Memory architecture"
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference (CICC), 2015 IEEE
Type
conf
DOI
10.1109/CICC.2015.7338357
Filename
7338357
Link To Document