Title :
Session 3 — Optical interconnect and reliability enhancement techniques
Author :
Tetsuya Iizuka;Takahiro Yamaguchi
Author_Institution :
University of Tokyo
Abstract :
This session presents state-of-the-art electrical and optical concurrent design techniques for optical interconnect as well as reliability enhancement approaches for device aging.
Keywords :
"Optical interconnections","Temperature measurement","Optical transmitters","Timing","Monitoring","Temperature sensors","Reliability"
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2015 IEEE
DOI :
10.1109/CICC.2015.7338463
