Title :
Mid-infrared integrated photonics on a SiGe platform
Author :
L. Carletti;C. Blanchard;D. Allioux;C. Monat;R. Orobtchouk;P. Rojo-Romeo;Z. Lin;C. Jamois;J-L. Leclercq;P. Viktorovitch;X. Letartre;C. Grillet;M. Brun;S. Ortiz;P. Labeye;S. Nicoletti;P. Ma;Y. Yu;B. Luther-Davies;D. Hudson;S. Madden;M. Sinobab;D. J. Moss
Author_Institution :
University of Lyon, Institut des Nanotechnologies de Lyon, Ecole Centrale de Lyon, Ecully, France
fDate :
6/1/2015 12:00:00 AM
Abstract :
The mid-infrared is of great interest for a huge range of applications such as medical and environment sensors, security, defense and astronomy. I will give a broad overview of the different activities recently launched in INL Lyon, in close collaboration with several French and Australian institutions, under the umbrella of “Mid-IR integrated photonics” with a particular focus on novel integrated sources for the Mid-IR exploiting a nonlinear SiGe platform.
Keywords :
"Photonics","CMOS integrated circuits","Optical device fabrication","Optical variables measurement","Optical losses","Loss measurement","Optical sensors"
Conference_Titel :
Opto-Electronics and Communications Conference (OECC), 2015
Electronic_ISBN :
2166-8892
DOI :
10.1109/OECC.2015.7340157
