DocumentCode :
36998
Title :
Terahertz Digital Holographic Imaging of Voids Within Visibly Opaque Dielectrics
Author :
Heimbeck, Martin S. ; Wei-Ren Ng ; Golish, Dathon R. ; Gehm, Michael E. ; Everitt, Henry O.
Author_Institution :
Aviation & Missile RD&E Center, Charles M. Bowden Res. Center, Redstone Arsenal, AL, USA
Volume :
5
Issue :
1
fYear :
2015
fDate :
Jan. 2015
Firstpage :
110
Lastpage :
116
Abstract :
Terahertz digital off-axis holography (THzDH) has been demonstrated as a non-destructive tool for imaging voids within visually opaque dielectrics. Using a raster scanning heterodyne detector, the imager captures lensless transmission holograms formed by the interaction of a highly coherent, monochromatic beam with 3-D printed structures. Digital hologram reconstructions from two structures were used to measure the imager´s modulation transfer function and to show that terahertz digital holography can provide sub-millimeter resolution images of voids within visually opaque printed structures. As a demonstration we imaged embedded air- and lossy dielectric filled-voids whose refractive indices differ from the host material.
Keywords :
holography; image reconstruction; image resolution; microwave photonics; optical transfer function; terahertz wave imaging; 3D printed structures; digital hologram reconstructions; lensless transmission holograms; lossy dielectric filled-voids; modulation transfer function; monochromatic beam; nondestructive imaging tool; raster scanning heterodyne detector; refractive index; submillimeter resolution images; terahertz digital holographic imaging; terahertz digital holography; terahertz digital off-axis holography; visibly opaque dielectrics; visually opaque dielectrics; visually opaque printed structures; voids; Detectors; Dielectrics; Image reconstruction; Image resolution; Imaging; Materials; Receivers; Holography; submillimeter-wave measurements; submillimeter-wave propagation;
fLanguage :
English
Journal_Title :
Terahertz Science and Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-342X
Type :
jour
DOI :
10.1109/TTHZ.2014.2364511
Filename :
6953319
Link To Document :
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