DocumentCode :
3699890
Title :
SiGe HBT and BiCMOS process integration optimization within the DOTSEVEN project
Author :
J. Böck;K. Aufinger;S. Boguth;C. Dahl;H. Knapp;W. Liebl;D. Manger;T. F. Meister;A. Pribil;J. Wursthorn;R. Lachner;B. Heinemann;H. Rücker;A. Fox;R. Barth;G. Fischer;S. Marschmeyer;D. Schmidt;A. Trusch;C. Wipf
Author_Institution :
Infineon Technologies, Neubiberg, Germany
fYear :
2015
Firstpage :
121
Lastpage :
124
Abstract :
This paper describes the technology development activities within the European funding project DOTSEVEN done by Infineon and IHP. After half of the project duration Infineon has developed a 130 nm SiGe BiCMOS technology with fT of 250 GHz and fmax of 370 GHz. State-of-the-art MMIC performance is demonstrated by a 77 GHz automotive radar transmitter. The suitability of IHṔs advanced SiGe HBT module with epitaxial base link for future industrial BiCMOS platforms is demonstrated by integrating it in Infineon´s 130 nm process resulting in an fmax of 500 GHz, 1.8 ps gate delay and a record 161 GHz static frequency divider. IHP has achieved an fmax of 570 GHz for the first time using an HBT concept with non-selective epitaxial base deposition and an elevated extrinsic base.
Keywords :
"Decision support systems","Large scale integration"
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting - BCTM, 2015 IEEE
Type :
conf
DOI :
10.1109/BCTM.2015.7340549
Filename :
7340549
Link To Document :
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