DocumentCode
3701651
Title
Electrochemical migration of Ag in Na2SO4 environment
Author
B?lint Medgyes;S?ndor ?d?m;B?la Szikora;L?szl? G?l;Patrik Tam?si
Author_Institution
Department of Electronics Technology, Budapest University of Technology and Economics, Hungary
fYear
2015
Firstpage
377
Lastpage
380
Abstract
The effect of sulphate ion concentration on electrochemical migration (ECM) of silver was investigated by applying an in-situ optical and electrical inspection system. It was found that dendrites grow not only in an electrolyte solution with low sulphate ion concentration but also in electrolytes with medium and high or even saturated sulphate ion concentrations. According to the Mean-Time-To-Failure (MTTF) values, the migration susceptibility was decreased with the increase of sulphate ion concentration in case of low and medium concentration levels. However, the ECM susceptibility was increased at saturated concentration level.
Keywords
"Electronic countermeasures","Silver","Voltage measurement","Ions","Cathodes","Crystals"
Publisher
ieee
Conference_Titel
Design and Technology in Electronic Packaging (SIITME), 2015 IEEE 21st International Symposium for
Type
conf
DOI
10.1109/SIITME.2015.7342357
Filename
7342357
Link To Document