• DocumentCode
    3701689
  • Title

    Generalization of an outlier model into a “global” perspective

  • Author

    Sebastian Siatkowski;Chia-Ling Chang;Li-C. Wang;Nikolas Sumikawa;LeRoy Winemberg;W. Robert Daasch

  • Author_Institution
    University of California, Santa Barbara
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    In this work, we study the generalization of an outlier model from two perspectives, temporal and spatial. We show that model generalization with existing distribution-based outlier analysis methods can vary significantly. We then propose a “big data” outlier analysis approach together with a probability-based outlier evaluation for improving model generalization. Experiments are conducted based on two automotive product lines to explain the concepts and demonstrate the effectiveness of the proposed approach.
  • Keywords
    "Semiconductor device modeling","Uncertainty","Analytical models","Robustness","Semiconductor device measurement","Linear regression","Production"
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2015 IEEE International
  • Type

    conf

  • DOI
    10.1109/TEST.2015.7342396
  • Filename
    7342396