DocumentCode
3701689
Title
Generalization of an outlier model into a “global” perspective
Author
Sebastian Siatkowski;Chia-Ling Chang;Li-C. Wang;Nikolas Sumikawa;LeRoy Winemberg;W. Robert Daasch
Author_Institution
University of California, Santa Barbara
fYear
2015
Firstpage
1
Lastpage
10
Abstract
In this work, we study the generalization of an outlier model from two perspectives, temporal and spatial. We show that model generalization with existing distribution-based outlier analysis methods can vary significantly. We then propose a “big data” outlier analysis approach together with a probability-based outlier evaluation for improving model generalization. Experiments are conducted based on two automotive product lines to explain the concepts and demonstrate the effectiveness of the proposed approach.
Keywords
"Semiconductor device modeling","Uncertainty","Analytical models","Robustness","Semiconductor device measurement","Linear regression","Production"
Publisher
ieee
Conference_Titel
Test Conference (ITC), 2015 IEEE International
Type
conf
DOI
10.1109/TEST.2015.7342396
Filename
7342396
Link To Document