DocumentCode
3701737
Title
Biaxial anisotropic sample design and rectangular to square waveguide material characterization system
Author
A. Knisely;M. Havrilla;P. Collins
Author_Institution
Air Force Institute of Technology (AFIT), Department of Electrical and Computer Engineering, 2950 Hobson Way, 45433, WPAFB, USA
fYear
2015
Firstpage
346
Lastpage
348
Abstract
An electrically biaxial anisotropic sample design methodology utilizing crystal-lographic symmetry is discussed. Sample synthesis equations based on equivalent capacitance analysis translate desired permittivity values and host materials to sample cell dimensions and are subsequently fabricated on a 3-D printer. Equivalent capacitance predictions yield permittivity tensor element values comparable to simulation results. A rectangular to square waveguide measurement system is also used to verify the sample design methodology.
Keywords
"Mathematical model","Tensile stress","Permittivity","Optical waveguides","Capacitance","Rectangular waveguides"
Publisher
ieee
Conference_Titel
Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2015 9th International Congress on
Type
conf
DOI
10.1109/MetaMaterials.2015.7342445
Filename
7342445
Link To Document