• DocumentCode
    3701737
  • Title

    Biaxial anisotropic sample design and rectangular to square waveguide material characterization system

  • Author

    A. Knisely;M. Havrilla;P. Collins

  • Author_Institution
    Air Force Institute of Technology (AFIT), Department of Electrical and Computer Engineering, 2950 Hobson Way, 45433, WPAFB, USA
  • fYear
    2015
  • Firstpage
    346
  • Lastpage
    348
  • Abstract
    An electrically biaxial anisotropic sample design methodology utilizing crystal-lographic symmetry is discussed. Sample synthesis equations based on equivalent capacitance analysis translate desired permittivity values and host materials to sample cell dimensions and are subsequently fabricated on a 3-D printer. Equivalent capacitance predictions yield permittivity tensor element values comparable to simulation results. A rectangular to square waveguide measurement system is also used to verify the sample design methodology.
  • Keywords
    "Mathematical model","Tensile stress","Permittivity","Optical waveguides","Capacitance","Rectangular waveguides"
  • Publisher
    ieee
  • Conference_Titel
    Advanced Electromagnetic Materials in Microwaves and Optics (METAMATERIALS), 2015 9th International Congress on
  • Type

    conf

  • DOI
    10.1109/MetaMaterials.2015.7342445
  • Filename
    7342445