Title :
Growth and properties of vacuum evaporated ZnSe thin films
Author :
Shail Sharma;Tarun Chandel;P. Rajaram
Author_Institution :
School of Studies in Physics, Jiwaji University, Gwalior (M.P.) India
Abstract :
Thin films of ZnSe were obtained on glass substrates in the temperature range 200 °C - 350 °C employing a Vacuum Co-evaporation method under a pressure of 1×106-2×10 6 torr. X-ray diffraction, SEM, AFM and Energy dispersive analysis of X-rays (EDAX) studies were performed to investigate the structural, morphological and compositional properties of the films. The optical properties of the films were also studied and some of the optical constants like refractive index, optical absorption coefficient (a) and optical bandgap (Eg) were determined using the transmission spectra.
Keywords :
"II-VI semiconductor materials","Zinc compounds","Optical films","Substrates","Optical refraction","Optical variables control"
Conference_Titel :
Opto-Electronics and Applied Optics (IEM OPTRONIX), 2015 2nd International Conference on
DOI :
10.1109/OPTRONIX.2015.7345531
